Document Type

Article

Creative Commons License

Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License.

Publication Date

5-1975

Abstract

A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.

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