Publication Date
2-1-2012
Document Type
Article
Abstract
Through simulations, this work explores the effects of conducting, semiconducting, and insulating substrates on the absorption of infrared radiation by radiative polaritons in oxide layers with thicknesses that range from 30 nm to 9 μm. Using atomic layer deposition, oxide layers can be formed in the nanometer scale. Our results suggest that the chemistry and conductivity of the substrate determine the amount of absorption by radiative polaritons in oxide layers thinner than the skin depth. The effects of the chemistry and conductivity of the substrate are especially effective for oxide films thinner than about 250 nm, which we label as the substrate sensitive thickness of the oxide film.
Creative Commons License
This work is licensed under a Creative Commons Attribution-Noncommercial-No Derivative Works 4.0 License.
Recommended Citation
Vincent-Johnson, A. J., Vasquez, K. A., Scarel, G., Hammonds, J. S., & Francoeur, M. (2012). Effects of Metallic, Semiconducting, and Insulating Substrates on the Coupling Involving Radiative Polaritons in Thin Oxide Films. Applied Spectroscopy, 66(2), 188197. doi:10.1366/11-06489
Comments
This paper was published in Applied Spectroscopy and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website:http://dx.doi.org/10.1366/11-06489. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.