A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.
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Baker, George H. III; McNutt, Alan D.; Shea, G. Bradford; and Rubenstein, David M., "Damage Analysis Modified TRAC Computer Program (DAMTRAC)" (1975). Department of Integrated Science and Technology - Faculty Scholarship. 4.